New optoelectronic tip design for ultrafast scanning tunneling microscopy

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چکیده

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New optoelectronic tip design for ultrafast scanning tunneling microscopy

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Scanning ultrafast electron microscopy.

Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...

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Scanning Tunneling Microscopy

The invention of the scanning tunneling microscope was a singularity event in the field of surface science and condensed matter physics. The ability to visualize individual atoms in an atomic structure was a huge step forward in experimental development, one for which the inventors were awarded the Nobel Prize in Physics in 1986. While a groundbreaking development, the Scanning Tunneling Micros...

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ژورنال

عنوان ژورنال: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

سال: 1996

ISSN: 0734-211X

DOI: 10.1116/1.589162