New optoelectronic tip design for ultrafast scanning tunneling microscopy
نویسندگان
چکیده
منابع مشابه
New optoelectronic tip design for ultrafast scanning tunneling microscopy
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Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...
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ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
سال: 1996
ISSN: 0734-211X
DOI: 10.1116/1.589162